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K. V. Oskolok, O. V. Monogarova
Semiempirical
Way of Determinarion of X-Ray Tube Emission Spectrum for Wave-Dispersive X-Ray Fluorescence Spectrometer
Abstract
The
laboratory way of determination of X-ray tube emission spectrum for
wavelength-dispersive X-ray fluorescence spectrometer was developed. This
approach is based on theoretical description of distortion of X-ray tube
emission spectrum by spectrometer monochromator and detector after radiation
scattering by surface layers of the special sample. The technique adequacy was
tested during standardless X-ray fluorescence analysis of several steel samples
by fundamental parameter method.
Copyright (C) Chemistry Dept., Moscow State University, 2002
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